ASML is one of the world’s leading manufacturers of chip-making equipment.
Our vision is to enable affordable microelectronics that improve the quality of life.
To achieve this, our mission is to invent, develop, manufacture and service advanced technology for high-tech lithography, metrology and software solutions for the semiconductor industry.
ASML's guiding principle is continuing Moore's Law towards ever smaller, cheaper, more powerful and energy-efficient semiconductors. This results in increasingly powerful and capable electronics that enable the world to progress within a multitude of fields, including healthcare, technology, communications, energy, mobility, and entertainment.
As a metrology engineer you will be a key player in making the performance of our scanners meet the customer's demands. The challenge is to introduce and maintain CD and Overlay metrology methods that meet the required accuracy and precision to measure feature sizes down to the 1xnm range. The metrology techniques that are currently routinely used are optical scatterometry and CD SEM.
Job Description
You will use your knowledge of CD and Overlay metrology to help assess the imaging performance of the ASML scanners. An important challenge is to make sure that the CD/Overlay metrology methods and algorithms are capable of measuring with the right accuracy and precision.You will be part of a group of people with similar competencies, working together to increase the metrology know-how, making sure to be prepared for challenges ahead. While you will also participate in the daily operation and project work, you will also have a big contribution to roadmaps and competence management plans.
In that respect you need the capability to convince management of the future requirements (e.g. tool investments, development activities).You will also be part of a multi-disciplinary imaging/overlay related project team, working together to meet a shared goal against challenging constraints.
Your role will be to review test plans, to determine the right metrology strategy and to support the project team by timely providing the required metrology data sets and conclusions.You will also work with internal and external metrology equipment vendors, to share best-known-methods and to communicate our roadmap requirements.
Solid technical background (Bsc/Msc in applied physics, applied mathematics or engineering).
Experience
Experience in the semiconductor industry, preferably in in-line metrology or lithography is a pre.In-depth knowledge and hands-on experience of CD SEM or scatterometry is also a pre.
Personal skills
Are you challenged by demanding projects in a multidisciplinary context? Do you have the capabilities and the drive to provide effective solutions to complex technical problems under challenging time constraints? Are you able to manage the gap between imaging performance of our scanners and what is needed for our customers?
Please contact us today. We currently have an exciting opportunity for a Metrology Engineer with Microscopy Experience in ASML's Performance & Integration department.
Please add your complete & recent CV and cover letter for this position to your application.We can't process your application without the above mentioned documents.You can apply for this job using below button: “Apply for this job”. Applications sent by email can't be processed.
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Education Backgrounds: |
Mathematics Micro / Nano Technology Physics |
Specialties: |
Control systems Experimental Physics Lab Analysis Laser/Photonics MEMS |
Education Level: |
Postgraduate (Masters) Doctorate (PH.D) |
Experience: |
0 - 2 years 2 - 5 years 5 - 10 Years |
Languages spoken: |
English |
Job Location: | Veldhoven, Netherlands |
Keywords: | CD metrology, in-line metrology, overlay metrology, semiconductor industry, lithography, statistics. |
Type: Job
Deadline: 5th May 2017
Job reference (ID): 11422
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