ASML is one of the world’s leading manufacturers of chip-making equipment.
Our vision is to enable affordable microelectronics that improve the quality of life.
To achieve this, our mission is to invent, develop, manufacture and service advanced technology for high-tech lithography, metrology and software solutions for the semiconductor industry.
ASML's guiding principle is continuing Moore's Law towards ever smaller, cheaper, more powerful and energy-efficient semiconductors. This results in increasingly powerful and capable electronics that enable the world to progress within a multitude of fields, including healthcare, technology, communications, energy, mobility, and entertainment.
As a Measurement Application Engineer on overlay and focus you will specify, design, develop, realize, and test subsystems. This will be within the limits of system specifications, costs and project planning.
You will have an active role in reviewing technical contributions from the team. You define requirements of new functional modules in the Yieldstar, based on new features which are requested by the customer.
You have to realize detailed designs for proposed solutions and prepare for testing and roll out of this functionality after implementation.
In the position you need to travel to customers and operate on-site for a period of one or more weeks at the time on a regular basis.
Job Description •
Wafer metrology within the framework of lithography (overlay and/or scanner focus measurement)•
Data analysis and performance analysis. This with an overview of the entire value chain towards the customer.
This includes the analysis of issues which are related to processing artefacts interfering with the accuracy of the data•
Realize Performance on Improvements (technically and usability) of wafer measurements using scatterometry, this includes hardware and software improvements of the scatterometry based metrology system.
Context of the position
The Business line Applications provides integrated solutions with computational, metrology and control technology for extendibility and improved efficiency of lithography products.
Within the Development & Engineering of the Applications business line, the Yieldstar Overlay and Focus group is part of the On Product Performance department.
Yieldstar Overlay & Focus covers the area of physics and mathematics based functionality development required to extract relevant Overlay & Focus metrics from the raw acquisitions of the Yieldstar metrology tools.
The group is responsible for the design, integration and test of new measurement functions enabling the applications of the metrology tool. In addition the group contributes in the area of reticle marker design in tight interaction with the Design for Control development team (Brion) that is based in Santa Clara, US.
Master or PhD in Physics or Engineering, •
Established experience in customer interaction and application support. Preferably in the area of metrology or tuning of semiconductor processes
Experience
3-5 years' experience in a relevant work environment within the industry
Personal skills •
Result oriented attitude; we are looking for an person that can work with set deadlines•
Pragmatic approach; you should be capable of thinking in pragmatic solutions •
Pro-active; it is expected that you take initiative to (help) drive progress
Other Information
A motivation letter to apply for this position is required.Travel requirements: this job may require you to travel to locations worldwide.
Please apply using the apply button below.
Contact Information
RC01972-QR-COM
| Education Backgrounds: |
Mathematics Micro / Nano Technology Physics |
| Specialties: |
Algorithms Control systems Mathematics Modeling Optics |
| Education Level: |
Undergraduate (Bachelors) Postgraduate (Masters) |
| Experience: |
0 - 2 years 2 - 5 years 5 - 10 Years |
| Languages spoken: |
English |
| Job Location: | Veldhoven, Netherlands |
Type: Job
Deadline: 20th September 2015
Job reference (ID): 8783
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