ASML is one of the world’s leading manufacturers of chip-making equipment.
Our vision is to enable affordable microelectronics that improve the quality of life.
To achieve this, our mission is to invent, develop, manufacture and service advanced technology for high-tech lithography, metrology and software solutions for the semiconductor industry.
ASML's guiding principle is continuing Moore's Law towards ever smaller, cheaper, more powerful and energy-efficient semiconductors. This results in increasingly powerful and capable electronics that enable the world to progress within a multitude of fields, including healthcare, technology, communications, energy, mobility, and entertainment.
Within D&E Applications, the group YieldStar reconstruction and algorithms covers the development of physical, optical and mathematical models and methods required to extract specific lithographic parameters by means of optical scatterometry.Relevant new metrics and algorithms, as well as new measurement functions, with optimum performance characteristics using the raw acquisitions are identified, designed and implemented.The group secures both the physical Scatterometry Competency and the mathematical Algorithms Competency.
Job Description
- Propose and develop new optical solutions and new metrology sensor-models to improve semiconductor metrology extending beyond the optical resolution limit. In this, new or improved metrics and algorithms for semiconductor metrology applications play an important role.
Ph.D. in Physics, Astrophysics, Applied Mathematics, or Electrical Engineering
Experience
Contact Information
RC00541-QR-COM
Education Backgrounds: |
Mathematics Micro / Nano Technology Physics |
Specialties: |
Mathematics Modeling Nanotechnology Optics Precision Engineering |
Education Level: |
Postgraduate (Masters) Doctorate (PH.D) |
Experience: |
0 - 2 years 2 - 5 years |
Languages spoken: |
English |
Job Location: | Veldhoven, Netherlands |
Type: Job
Deadline: 25th December 2014
Job reference (ID): 7730
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