PhD position in Metrology Job Description
This is a four year research project that should lead to a PhD at Delft University of Technology. Current metrology tools cover the 45nm lithographic node. This project proposes new routes for metrology that will enable fast (1 sec.) and in situ analysis of structured surfaces for the 22nm node (planned for 2013). Topics that will be researched are:
- extension of scatterometry to the UV range, exploration of polarization and phase of the field, and usage of singular beams for retrieval of information via the angular momentum of the scattered field. The goal is to push optical scatterometry to its very limits;
- application of the microscopy technique based on stimulated fluorescence techniques (STED) on a dye-doped resist. The goal is to reach resolution far beyond the diffraction limit.
The research will be carried out in the Optics Group of Delft University of Technology. Throughout the project there will be a close collaboration with scientists at ASML who have a lot of experience in scatterometry of wafers. The project comprises theoretical investigation of the sensitivity of the proposed set-ups as well as experimental validation.
Conditions of EmploymentThe extent of this position is a maximum of 38 hours per week (1 FTE). This position has a temporary employment basis of 1 year (12 months). The estimated PhD starting salary is € 2,042 per month gross, with a maximum of € 2,612 gross (based on a full-time appointment and depending on experience). Benefits and other employment conditions are in accordance with the Collective Labour Agreement for Dutch Universities.
The successful candidate will be employed by TU Delft for a fixed period of 4 years (48 months). Within nine months from the start of the PhD research, the appointee will present his or her proposal to a scientific committee. If the proposal is approved, the appointment will be extended for another three years within which he/she is expected to write a dissertation leading to the Dr title (PhD thesis).
With regard to selection, internal candidates take precedence over external candidates. TU Delft strives to increase the number of women in higher academic positions; women are thus especially encouraged to apply.
PhD position in Metrology Job Requirements
Applicants should have graduated in physics. Knowledge of geometrical and/or physical optics is recommended. Delft University of Technology is a bilingual organisation. A good command of English (written and spoken) is essential.
PhD position in Metrology Application Information
For further details on the position you are welcome to contact Prof. H.P. Urbach.
Phone: +31 (0) 15 – 27 86146 or: +31 (0)15 – 27 81444,
Email: [email protected].
To apply, please send a detailed CV together with a letter of motivation to:
Delft University of Technology, Faculty of Applied Sciences, attn. Prof. H.P. Urbach, Lorentzweg 1, 2628 CJ Delft, The Netherlands;
Or apply online by the 'apply' button below.
PhD position in Metrology Summary
| Education Backgrounds: |
Physics
|
| Specialties: |
Experimental Physics
Optics
Research (R&D)
|
| Education Level: |
Postgraduate (Masters)
|
| Experience: |
0 - 2 years
2 - 5 years
|
| Languages spoken: |
English
|
| Job Location: |
Delft, Netherlands |
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